Metal/InP thin film reactions: Studies using mass and energy dispersive recoil spectrometry-Reference-Cited by-同舟云学术

Metal/InP thin film reactions: Studies using mass and energy dispersive recoil spectrometry

Published:1995-07 Issue:7 Volume:46 Page:737-738
ISSN:0042-207X
Container-title:Vacuum
language:en
Short-container-title:Vacuum

Author:

Whitlow Harry J,Andersson Margaretha,Hult Mikael,Persson Leif,El Bouanani Mohamed,Östling Mikael,Zaring Carina,Lundberg Nils,Cohen David D,Dytlewski Nick,Johnston Peter N,Bubb Ian F,Walker Scott R

Publisher

Elsevier BV

Subject

Surfaces, Coatings and Films,Condensed Matter Physics,Instrumentation

Reference8 articles.

1. An X-ray diffraction study of the solid phase equilibria in some MInP systems (MNi, Pd, Pt)

2. High‐resolution recoil spectrometry for separate characterization of Ga and As in AlxGa(1−x)As structures

3. Rapid thermal annealing induced reactions of Co/GaAs thin film structures: Studies using mass and energy dispersive recoil spectrometry

4. RBS and recoil spectrometry analysis of CoSi2 formation on GaAs

Cited by 3 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Separation of mass-overlapped time of flight–energy elastic recoil detection analysis data using Ryan and Jamieson's dynamic analysis method;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2001-08

2. Ion beam induced damage in InP during heavy-ion elastic recoil detection analysis;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;1997-07

3. Recoil spectrometry: Ion accelerator based elemental characterisation of surface layers;Mikrochimica Acta;1995-03