Mass and energy dispersive elastic recoil detection studies of low temperature Si/Pd/GaAs and Si/Pd/AlxGa(1 − x)As interfacial reactions-Reference-Cited by-同舟云学术

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Mass and energy dispersive elastic recoil detection studies of low temperature Si/Pd/GaAs and Si/Pd/AlxGa(1 − x)As interfacial reactions

Published:1998-03 Issue: Volume:136-138 Page:719-723
ISSN:0168-583X
Container-title:Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
language:en
Short-container-title:Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms

Author:

Zhang Yanwen,Hult Mikael,Persson Leif,Whitlow Harry J.,Andersson Margaretha,Bubb Ian F.,El Bouanani Mohamed,Johnston Peter N.,Walker Scott R.,Cohen David D.,Dytlewski Nick,Östling Mikael,Zaring Carina

Publisher

Elsevier BV

Subject

Instrumentation,Nuclear and High Energy Physics

Reference18 articles.

1. RBS and recoil spectrometry analysis of CoSi2 formation on GaAs

2. Formation of thin films of CoSi2 on GaAs

3. The structural and electrical properties of low‐resistance Ni contacts to InP

4. Schottky barrier inhomogeneities in Au-Ni and Au-Cr contacts to InP-ohmic contact applications

5. Compound formation and kinetics in Al–Pd2Si reactions

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