A study of the charging phenomena during electron irradiation of sintered Si3N4
Author:
Publisher
Elsevier BV
Subject
Instrumentation,Nuclear and High Energy Physics
Reference29 articles.
1. Damage and recovery by electron and ion beam irradiation during AES analysis of silicon oxynitrides
2. Reduction of charging in surface analysis of insulating materials by AES
3. Some physical descriptions of the charging effects of insulators under incident particle bombardment
4. Charging Phenomena and Charge Compensation in AES on Metal Oxides and Silica
5. Electron beam damage in Auger electron spectroscopy
Cited by 3 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献
1. Monte Carlo study on the surface potential measurement using the peak-shift method;Applied Surface Science;2020-02
2. Charge Implantation Measurement on Electron-Irradiated Insulating Materials by Means of a SEM Technique;Microscopy and Microanalysis;2004-12
3. Preparation and properties of clean Si3N4 surfaces;Applied Surface Science;2004-08
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