Specular reflectance and surface roughness of silicon on sapphire
Author:
Publisher
Elsevier BV
Subject
Materials Chemistry,Inorganic Chemistry,Condensed Matter Physics
Reference12 articles.
1. Measurement of the near-surface crystallinity of silicon on sapphire by UV reflectance
2. The characterization of heteroepitaxial silicon
3. ION IMPLANTATION DAMAGE OF SILICON AS OBSERVED BY OPTICAL REFLECTION SPECTROSCOPY IN THE 1 TO 6 eV REGION
4. CHANGES OF OPTICAL REFLECTIVITY (1.8 TO 2.2 eV) INDUCED BY 40 ‐ keV ANTIMONY ION BOMBARDMENT OF SILICON
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1. Omnidirectional reflectance and vanishing Brewster angle of disordered semiconductor nanopillar surface with gradually changed refractive index;Journal of Applied Physics;2011-04-15
2. Low-temperature epitaxy of silicon by electron beam evaporation;Thin Solid Films;2007-07
3. Polarization-dependent angular reflectance of silicon and germanium in the infrared;Infrared Physics & Technology;1996-06
4. ELLIPSOMETRY AND LIGHT SCATTERING CHARACTERIZATION OF SEMICONDUCTOR SURFACES;Photonic Probes of Surfaces;1995
5. Specular reflectance of silicon and germanium at variable angles of incidence in the infrared region;Infrared Physics;1993-02
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