Residual stress measurement in silicon sheet by shadow moiré interferometry
Author:
Publisher
Elsevier BV
Subject
Materials Chemistry,Inorganic Chemistry,Condensed Matter Physics
Reference11 articles.
1. High speed EFG of wide silicon ribbon
2. Plastic deformation influence on stress generated during silicon sheet growth at high speeds
3. Silicon ribbon growth by the dendritic web process
4. Dislocation dynamics of web type silicon ribbon
5. Residual stresses of thin, short rectangular plates
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1. Residual stress and dislocations density in silicon ribbons grown via optical zone melting;Journal of Applied Physics;2013-02-28
2. On the residual stress and fracture strength of crystalline silicon wafers;Applied Physics Letters;2013-01-14
3. Simultaneous measurement of displacement, strain and curvature in digital holographic interferometry using high-order instantaneous moments;Optics Express;2009-09-18
4. Audible vibration diagnostics of thermo-elastic residual stress in multi-crystalline silicon wafers;Applied Acoustics;2006-06
5. Measurement of residual stress in EFG ribbons using a phase-shifting IR photoelastic method;Solar Energy Materials and Solar Cells;2005-05
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