In-situ observation of solid-liquid interface shape by X-ray radiography during silicon single crystal growth
Author:
Publisher
Elsevier BV
Subject
Materials Chemistry,Inorganic Chemistry,Condensed Matter Physics
Reference10 articles.
1. Thermal-capillary analysis of Czochralski and liquid encapsulated Czochralski crystal growth
2. Thermal-capillary analysis of Czochralski and liquid encapsulated Czochralski crystal growth
3. On the dynamics of Czochralski crystal growth
4. Striations in Undoped Semi-Insulating LEC GaAs
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