Author:
Brugger J.,Buser R.A.,de Rooij N.F.
Subject
Electrical and Electronic Engineering,Metals and Alloys,Surfaces, Coatings and Films,Condensed Matter Physics,Instrumentation,Electronic, Optical and Magnetic Materials
Reference30 articles.
1. Atomic force microscope;Binnig;Phys. Rev. Lett.,1986
2. Nanometer scale structure fabrication with the scanning tunneling microscope
3. Large-scale charge storage by scanning capacitance microscopy presented at;Barrett;STM '91 Conf. Interlaken, Switzerland,1991
4. Atomic force microscopy: general principles and a new implementation;McClelland,1987
5. Atomic imaging by ‘force microscopy’ with 1000 Å resolution;Martin;Appl. Phys. Lett.,1987
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