Silicon nanoclusters formation in silicon dioxide by high power density electron beam
Author:
Publisher
Elsevier BV
Subject
Electrical and Electronic Engineering,Condensed Matter Physics,Electronic, Optical and Magnetic Materials
Reference7 articles.
1. Modification of Silicon Oxide by High Energy Electron Beam
2. Calculation of the thermal effect of an electron probe on a sample of GaN
3. Silicon dioxide modification by an electron beam
4. Structure Study of Si Nanocrystals Formed by Electron-Induced Reduction of SiO2at High Temperature
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