Controlled biaxial deformation of nanostructured W/Cu thin films studied by X-ray diffraction-Reference-Cited by-同舟云学术

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Controlled biaxial deformation of nanostructured W/Cu thin films studied by X-ray diffraction

Published:2010-11 Issue:5 Volume:205 Page:1420-1425
ISSN:0257-8972
Container-title:Surface and Coatings Technology
language:en
Short-container-title:Surface and Coatings Technology

Author:

Djaziri S.,Thiaudière D.,Geandier G.,Renault P.-O.,Le Bourhis E.,Goudeau P.,Castelnau O.,Faurie D.

Publisher

Elsevier BV

Subject

Materials Chemistry,Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics,General Chemistry

Reference27 articles.

1. A comparison of the strength of multilayers, thin films and nanocrystalline compacts

2. Mechanical properties of nanocrystalline materials

3. Mechanisms of reversible stretchability of thin metal films on elastomeric substrates

4. Significant improvement of adhesion between gold thin films and a polymer

5. Brittle-to-ductile transition in ultrathin Ta/Cu film systems

Cited by 8 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Study on the Crack Propagation of Stiff-Thin-Film-on-Soft-Substrate Structures under Biaxial Loading;Materials;2022-10-22

2. Fatigue Life Prediction of Steel Pipelines Based on X-ray Diffraction Analyses;Journal of Materials Engineering and Performance;2021-09-16

3. Nano-scale residual stress depth profiling in Cu/W nano-multilayers as a function of magnetron sputtering pressure;Surface and Coatings Technology;2020-01

4. Synchrotron Radiation Experimental Techniques;Synchrotron Radiation in Materials Science;2018-02-16

5. Interface stress development in the Cu/Ag nanostructured multilayered film during the tensile deformation;Applied Physics Letters;2014-12

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