Trapping induced Neff and electrical field transformation at different temperatures in neutron irradiated high resistivity silicon detectors-Reference-Cited by-同舟云学术

Trapping induced Neff and electrical field transformation at different temperatures in neutron irradiated high resistivity silicon detectors

Published:1995-06 Issue:1-2 Volume:360 Page:458-462
ISSN:0168-9002
Container-title:Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment
language:en
Short-container-title:Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

Author:

Eremin V,Li Z,Iljashenko I

Publisher

Elsevier BV

Subject

Instrumentation,Nuclear and High Energy Physics

Reference9 articles.

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