The use of the signal current pulse shape to study the internal electric field profile and trapping effects in neutron damaged silicon detectors-Reference-Cited by-同舟云学术

The use of the signal current pulse shape to study the internal electric field profile and trapping effects in neutron damaged silicon detectors

Published:1993-03 Issue:1-2 Volume:326 Page:350-356
ISSN:0168-9002
Container-title:Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment
language:en
Short-container-title:Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

Author:

Kraner H.W.,Li Z.,Fretwurst E.

Publisher

Elsevier BV

Subject

Instrumentation,Nuclear and High Energy Physics

Reference15 articles.

1. Proc. 1st Int. Conf. on Calorimetry in High Energy Physics;Lindstrom,1991

2. Presented at the IEEE Nuclear Science Symposium;Pitzl,1991

3. presented at the IEEE Nuclear Science Symposium;Lemeilleur,1991

4. presented at the IEEE Nuclear Science Symposium;Li,1991

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