Performance comparison of 6T SRAM bit-cells based on side-contacted FED and CMOS

Author:

Ghafouri Tara,Manavizadeh Negin

Funder

Iran National Science Foundation

Publisher

Elsevier BV

Subject

General Engineering

Reference51 articles.

1. TFET-based robust 7T SRAM cell for low power application;Ahmad;IEEE Trans. Electron Devices,2019

2. Inverters with strained Si nanowire complementary tunnel field-effect transistors;Knoll;IEEE Electron Device Lett.,2013

3. Performance evaluation of 7 nm node negative capacitance FinFET based SRAM;Dutta;IEEE Electron Device Lett.,2017

4. S.O. Jung, M.G. Kang, H. Park, S.C. Song, M. Abu-Rahma, B.M. Han, L. Ge, Z. Wang, Stable SRAM bitcell design utilizing independent gate FinFET, U.S. patent, 2018, US9865330 B2.

5. Inherent charge-sharing-free dynamic logic gates employing transistors with multiple independent inputs, IEEE;Trommer;J. Electron Devices Soc.,2020

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