Atomic force microscopy of dislocation locking effects at gold film LiF substrate interface
Author:
Publisher
Elsevier BV
Subject
Condensed Matter Physics,General Materials Science,Mechanics of Materials,Metals and Alloys,Mechanical Engineering
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2. Strain mapping on gold thin film buckling and silicon blistering;MRS Proceedings;2005
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5. Atomic force microscopy investigation of buckling patterns of nickel thin films on polycarbonate substrates;Philosophical Magazine Letters;2002-09
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