Atomic force microscopy investigation of buckling patterns of nickel thin films on polycarbonate substrates
Author:
Publisher
Informa UK Limited
Subject
Condensed Matter Physics
Link
http://www.tandfonline.com/doi/pdf/10.1080/09500830210154688
Reference14 articles.
1. Interactive study of straight-sided buckling patterns in thin films under compressive stress
2. Worm-like delamination patterns of thin stainless steel films on polycarbonate substrates
3. Atomic force microscopy of dislocation locking effects at gold film LiF substrate interface
4. Selection of dielectrics for alternating-current thin-film electroluminescent device
5. Modelling oxide spallation
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3. Morphological evolutions of iron films on PDMS substrates under uniaxial compression/tension;Philosophical Magazine;2016-08-16
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