Scanning Probe Microscopy and Dislocations
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Publisher
Elsevier
Reference105 articles.
1. In-situ BEEM study of interfacial dislocations and point defects
2. Spatial variations of hot-carrier transmission acrossCoSi2/Si interfaces on a nanometer scale
3. Tunneling through a controllable vacuum gap
4. Surface Studies by Scanning Tunneling Microscopy
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