In-situ BEEM study of interfacial dislocations and point defects
Author:
Publisher
Elsevier BV
Subject
Materials Chemistry,Inorganic Chemistry,Condensed Matter Physics
Reference19 articles.
1. Direct investigation of subsurface interface electronic structure by ballistic-electron-emission microscopy
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Cited by 5 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献
1. Scanning Probe Microscopy and Dislocations;Dislocations in Solids;2004
2. BEEM imaging and spectroscopy of buried structures in semiconductors;Physics Reports;2001-08
3. Ballistic Electron Emission Microscopy onCoSi2/Si(111)Interfaces: Band Structure Induced Atomic-Scale Resolution and Role of Localized Surface States;Physical Review Letters;1998-11-30
4. Ballistic-Electron-Emission Microscopy on Epitaxial Silicides;Japanese Journal of Applied Physics;1998-06-30
5. Recent progress on BEEM;Ultramicroscopy;1998-06
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