A study on optical properties of Sb2Se3 thin films and resistive switching behavior in Ag/Sb2Se3/W heterojunctions
Author:
Funder
Natural Science Foundation of Shanghai
National Natural Science Foundation of China
Publisher
Elsevier BV
Subject
General Physics and Astronomy
Reference35 articles.
1. Investigations on phase change characteristics of Ti-doped Ge2Sb2Te5 system;Cheng;J Phys D Appl Phys,2015
2. Investigation on the optical phase change properties of intrinsic GeSb and Ti-doped GeSb;Liu;Opt Mater Express,2018
3. Thin-film Sb2Se3 photovoltaics with oriented one-dimensional ribbons and benign grain boundaries;Zhou;Nat Photonics,2015
4. Strong nonlinear saturation absorption-induced optical pinhole channel and super-resolution effects: a multi-layer system model;Wei;Opt Lett,2014
5. Preparation and characterization of Sb2Se3 thin films prepared by electrodeposition for photovoltaic applications;Fernandez;Thin Solid Films,2000
Cited by 33 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. Selenization-induced [001]-oriented Sb2Se3 film formation and its photo-sensing characteristics;Materials Chemistry and Physics;2024-08
2. Crystalline Antimony Selenide Thin Films for Optoelectronics through Photonic Curing;Chemistry of Materials;2024-06-07
3. Structural, morphological, and temperature-tuned bandgap properties of single-step thermally evaporated Sb2Se3 thin films;Applied Physics A;2024-03-28
4. Growth and Characterization of p-Type and n-Type Sb2Se3 for Use in Thin-Film Photovoltaic Solar Cell Devices;Energies;2024-01-13
5. Fabrication of Sb2S3/Sb2Se3 heterostructure for potential resistive switching applications;Nano Express;2024-01-03
1.学者识别学者识别
2.学术分析学术分析
3.人才评估人才评估
"同舟云学术"是以全球学者为主线，采集、加工和组织学术论文而形成的新型学术文献查询和分析系统，可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容，当前同舟云学术共收录了国内外主流学术期刊6万余种，收集的期刊论文及会议论文总量共计约1.5亿篇，并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询！咨询电话：010-8811{复制后删除}0370
www.globalauthorid.com
TOP
Copyright © 2019-2024 北京同舟云网络信息技术有限公司 京公网安备11010802033243号 京ICP备18003416号-3