Comprehensive noise performance of ultrathin oxide MOSFETs at low frequencies
Author:
Publisher
Elsevier BV
Subject
Materials Chemistry,Electrical and Electronic Engineering,Condensed Matter Physics,Electronic, Optical and Magnetic Materials
Reference25 articles.
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4. Lee JH, Bosman G, Green KR, Ladwig D. Gate leakage current noise in ultrathin gate oxide MOSFETs. In: Proceedings of the 16th International Conference on Noise in Physical Systems and 1/f Fluctuations, 2001, pp.165–168
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