Author:
Crupi F.,Giusi G.,Iannaccone G.,Magnone P.,Pace C.,Simoen E.,Claeys C.
Subject
General Physics and Astronomy
Reference26 articles.
1. Noise as a diagnostic tool for quality and reliability of electronic devices
2. A. L. McWorther, in Semiconductor Surface Physics, edited by R. H. Kingston (University of Pennsylvania Press, Philadelphia, 1957), p. 207.
3. Low frequency noise in MOS transistors—I Theory
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