Radial distribution analysis of amorphous Al0.23Te0.77 by X-ray diffraction-Reference-Cited by-同舟云学术

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Radial distribution analysis of amorphous Al0.23Te0.77 by X-ray diffraction

Published:1978-06 Issue:3 Volume:28 Page:319-326
ISSN:0022-3093
Container-title:Journal of Non-Crystalline Solids
language:en
Short-container-title:Journal of Non-Crystalline Solids

Author:

d'Anjou Alicia,Sanz Francisco

Publisher

Elsevier BV

Subject

Materials Chemistry,Condensed Matter Physics,Ceramics and Composites,Electronic, Optical and Magnetic Materials

Reference15 articles.

1. Proc. 6th Int. Conf. on Amorphous and Liquid Semiconductors;Cornet,1975

2. Glass formation and D.S.C. data in the GeTe and AsTe memory glass systems

3. X-Ray Diffraction;Warren,1969

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1. Synthesis and the RDF fine structure of Ge0.15Te0.78Cu0.07 bulk alloy;Optik;2016-10

2. Characterization of short-range order in an amorphous Cd–Se–Te system by wide angle X-ray scattering(WAXS);NDT & E International;2003-12

3. Composition dependence of electrical properties of Al–Te glasses;Journal of Non-Crystalline Solids;1999-07

4. Short-range order and atomic arrangement in the semiconducting glassy Sb0.05As0.45Se0.50 by X-ray diffraction;Materials Letters;1998-08

5. Al coordination in bulkAlxTe1−xglasses from solid-state NMR;Physical Review B;1998-01-01

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