Characterization of short-range order in an amorphous Cd–Se–Te system by wide angle X-ray scattering(WAXS)-Reference-Cited by-同舟云学术

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Characterization of short-range order in an amorphous Cd–Se–Te system by wide angle X-ray scattering(WAXS)

Published:2003-12 Issue:8 Volume:36 Page:619-623
ISSN:0963-8695
Container-title:NDT & E International
language:en
Short-container-title:NDT & E International

Author:

Fayek S.A.,El-Sayed S.M.

Publisher

Elsevier BV

Subject

Mechanical Engineering,Condensed Matter Physics,General Materials Science

Reference14 articles.

1. Enhancement of Tc in Y1−xPrxCu2.8Re0.2O6+z (z ∼ 1; x=0,0.75) due to the elevated oxygen pressure annealing

2. Modeling of the spatial structure by means of wide-angle x-ray scattering and extended x-ray-absorption fine structure for theCu8As26Se66andCu26As37Se37semiconductor alloys

3. E X-ray diffraction;Warren,1974

Cited by 2 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Structural and Electronic Properties of Indium-Doped n-type Cd-Se-Te Crystals;Journal of Electronic Materials;2024-04-29

2. Structural correlations of AsGeSe glasses;Physica B: Condensed Matter;2005-04

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