Author:
Zhu Ming,Xiao Li Yi,Song Li Li,Zhang Yan Jing,Luo Hong Wei
Reference22 articles.
1. Effects of atmospheric neutrons on devices, at sea level and in avionics embedded systems;Leray;Microelectron. Reliab.,2007
2. Design of a fault tolerant solid state mass memory;Cardarilli;IEEE Trans. Reliab.,2003
3. Radiation-induced soft errors in advanced semiconductor technologies;Baumann;IEEE Trans. Dev. Mater. Reliab.,2005
4. R. Naseer, J. Draper, Parallel double error correcting code design to mitigate multi-bit upsets in SRAMs, in: Proceedings of the 34th European Solid-State Circuits Conference, 2008, pp. 222–225.
5. Multiple bit upset tolerant SRAM memory;Neuberger;ACM Trans. Des. Autom. Electron. Syst.,2003
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