Switching ECC Techniques with Decimal Matrix Code and Diagonal Hamming Code
Author:
Affiliation:
1. Engineering PES University,Electronics and communication,Bengaluru,India
Publisher
IEEE
Link
http://xplorestaging.ieee.org/ielx7/10505947/10505948/10505984.pdf?arnumber=10505984
Reference15 articles.
1. Investigation of multi-bit upsets in a 150 nm technology SRAM device
2. Impact of Scaling on Neutron-Induced Soft Error in SRAMs From a 250 nm to a 22 nm Design Rule
3. Improved decoding algorithm for high reliable reed muller coding
4. Hamming SEC-DAED and Extended Hamming SEC-DED-TAED Codes Through Selective Shortening and Bit Placement
5. Enhanced Memory Reliability Against Multiple Cell Upsets Using Decimal Matrix Code
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