Range of Er ions in amorphous Si
Author:
Publisher
Elsevier BV
Subject
Surfaces, Coatings and Films,Condensed Matter Physics,Surfaces and Interfaces,General Physics and Astronomy,General Chemistry
Reference35 articles.
1. Range of ion-implanted rare earth elements in Si and SiO2
2. The Stopping and Ranges of Ions in Solids;Ziegler,1985
3. Erbium in SiOx environment: ways to improve the 1.54μm emission
4. Range evaluation in SIMS depth profiles of Er-implantations in silicon
5. Redistribution of Er implanted into Si(100): Correlation with implantation induced damage
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