A practical guide to interpreting low energy ion scattering (LEIS) spectra-Reference-Cited by-同舟云学术

A practical guide to interpreting low energy ion scattering (LEIS) spectra

Published:2023-11 Issue: Volume: Page:158793
ISSN:0169-4332
Container-title:Applied Surface Science
language:en
Short-container-title:Applied Surface Science

Author:

Průša Stanislav^ORCID,Linford Matthew R.,Vaníčková Elena,Bábík Pavel,Pinder Joshua W.,Šikola Tomáš,Brongersma Hidde H.

Funder

TA CR

Ministerstvo Školství, Mládeže a Tělovýchovy

GAČR

Central European Institute of Technology

Publisher

Elsevier BV

Subject

Surfaces, Coatings and Films,Condensed Matter Physics,Surfaces and Interfaces,General Physics and Astronomy,General Chemistry

Reference127 articles.

1. Applications of high sensitivity-low energy ion scattering (HS-LEIS) in heterogeneous catalysis;ter Veen;Catal. Today,2009

2. Surface analysis of zeolites: An XPS, variable kinetic energy XPS, and low energy ion scattering study;Bare;Surf. Sci.,2016

3. Stabilizing High Metal Loadings of Thermally Stable Platinum Single Atoms on an Industrial Catalyst Support;Kunwar;ACS Catal.,2019

4. The application of low energy ion scattering spectroscopy (LEIS) in sub 28-nm CMOS technology;Dittmar;Surf. Interface Anal.,2017

5. Intermixing and thermal oxidation of ZrO2 thin films grown on a-Si, SiN, and SiO2 by metallic and oxidic mode magnetron sputtering;Coloma Ribera;J. Appl. Phys.,2017

Cited by 8 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. On the reconstruction of LEIS spectra after distortion by an electrostatic energy analyzer;Applied Surface Science;2024-12

2. Examining the influence of W thickness on the Si-on-W Interface: A comparative metrology analysis;Applied Surface Science;2024-10

3. On the question whether surface roughness can explain the absence of a prominent single-collision peak in keV heavy-ion scattering off a polycrystalline Ru surface;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2024-09

4. Signal oscillations in helium scattering by bismuth atoms in the low energy range;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2024-08

5. Immersion ellipsometry for the uncorrelated determination of ultrathin film thickness and index of refraction: Theory and examples;Journal of Vacuum Science & Technology A;2024-07-24