Editorial to the proceedings of the 7th conference on spectroscopic ellipsometry (ICSE-7)

Author:

Hertwig Andreas,Hinrichs Karsten,Beck Uwe,Esser Norbert

Publisher

Elsevier BV

Subject

Surfaces, Coatings and Films,Condensed Matter Physics,Surfaces and Interfaces,General Physics and Astronomy,General Chemistry

Reference10 articles.

1. Ellipsometry: a survey of concept;Cobet;Springer Ser. Surf. Sci.,2014

2. The ellipsometer, an apparatus to measure thicknesses of thin surface films;Rothen;Rev. Sci. Instrum.,1945

3. Ellipsometry at the Nanoscale,2012

4. Ellipsometry of Functional Organic Surfaces and Films,2014

5. VUV-ellipsometry on GaN: probing conduction band properties by core level excitations;Esser;Phys. Status Solidi B,2005

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