The Ellipsometer, an Apparatus to Measure Thicknesses of Thin Surface Films-Reference-Cited by-同舟云学术

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The Ellipsometer, an Apparatus to Measure Thicknesses of Thin Surface Films

Published:1945-02 Issue:2 Volume:16 Page:26-30
ISSN:0034-6748
Container-title:Review of Scientific Instruments
language:en
Short-container-title:Review of Scientific Instruments

Author:

Rothen Alexandre

Publisher

AIP Publishing

Subject

Instrumentation

Link

http://aip.scitation.org/doi/pdf/10.1063/1.1770315

Reference3 articles.

1. Built-Up Films of Barium Stearate and Their Optical Properties

2. Bestimmung der optischen Constanten der Metalle

3. Beiträge zur Kenntnis der Oberflächenschichten auf Metallen

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