Structural characterization of ultrathin Cr and Sc films for soft X-ray mirrors-Reference-Cited by-同舟云学术

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Structural characterization of ultrathin Cr and Sc films for soft X-ray mirrors

Published:2004-05 Issue:1-4 Volume:230 Page:1-7
ISSN:0169-4332
Container-title:Applied Surface Science
language:en
Short-container-title:Applied Surface Science

Author:

Gorelik Tatiana,Kaiser Ute,Kuhlmann Thomas,Yulin Sergey,Richter Wolfgang

Publisher

Elsevier BV

Subject

Surfaces, Coatings and Films,Condensed Matter Physics,Surfaces and Interfaces,General Physics and Astronomy,General Chemistry

Reference33 articles.

1. Multilayers For X-Ray Optics

2. Multilayers for high heat load synchrotron applications

3. Multilayer mirror based soft x-ray spectrometer as a high temperature plasma diagnostic

4. Multilayer mirror technology for soft-x-ray projection lithography

5. Schwarzschild soft-x-ray microscope for imaging of nonradiating objects

Cited by 4 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Thickness-dependent structural characteristics for a sputtering-deposited chromium monolayer and Cr/C and Cr/Sc multilayers;Journal of Synchrotron Radiation;2018-04-25

2. Effects of O and N impurities on the nanostructural evolution during growth of Cr/Sc multilayers;Journal of Materials Research;2009-01

3. In-Situ Time-of-Flight Neutron Diffraction Study of High-Temperature α-to-β Phase Transition in Elemental Scandium;Metallurgical and Materials Transactions A;2008-09-27

4. Effects of ion-assisted growth on the layer definition in Cr/Sc multilayers;Thin Solid Films;2008-01

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