Quantification of strain through linear dichroism in the Si 1s edge X-ray absorption spectra of strained Si1−xGex thin films-Reference-Cited by-同舟云学术

登录注册会员服务联系我们

Quantification of strain through linear dichroism in the Si 1s edge X-ray absorption spectra of strained Si1−xGex thin films

Published:2013-01 Issue: Volume:265 Page:358-362
ISSN:0169-4332
Container-title:Applied Surface Science
language:en
Short-container-title:Applied Surface Science

Author:

Cao W.,Masnadi M.,Eger S.,Martinson M.,Xiao Q.-F.,Hu Y.-F.,Baribeau J.-M.,Woicik J.C.,Hitchcock A.P.,Urquhart S.G.

Funder

NSERC

NRC (Canada)

CIHR

the Province of Saskatchewan

WED

University of Saskatchewan

University of Alberta

University of Oulu

Publisher

Elsevier BV

Subject

Surfaces, Coatings and Films,Condensed Matter Physics,Surfaces and Interfaces,General Physics and Astronomy,General Chemistry

Reference37 articles.

1. A fully-monolithic SiGe differential voltage-controlled oscillator for 5GHz wireless applications;Plouchart,2000

2. Normal incidence infrared detector usingp‐type SiGe/Si multiple quantum wells

3. Interfaces and performance: What future for nanoscale Ge and SiGe based CMOS?

4. Room-temperature light emission from a highly strained Si/Ge superlattice

5. Band structure and symmetry analysis of coherently grownSi1−xGexalloys on oriented substrates

Cited by 4 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Silicon 1s near edge X-ray absorption fine structure spectroscopy of functionalized silicon nanocrystals;The Journal of Chemical Physics;2016-10-21

2. Strain sensitivity in the nitrogen 1 s NEXAFS spectra of gallium nitride;Applied Surface Science;2014-10

3. X-RAY PHOTOEMISSION ELECTRON MICROSCOPE DETERMINATION OF ORIGINS OF ROOM TEMPERATURE FERROMAGNETISM AND PHOTOLUMINESCENCE IN HIGH Co-CONTENT CoxZn1-xO FILMS;Surface Review and Letters;2014-08

4. Inelastic electron scattering cross-section spectroscopy of Ge x Si1 − x nanoheterostructures;Semiconductors;2014-02

同舟云学术

1.学者识别学者识别

2.学术分析学术分析

3.人才评估人才评估

"同舟云学术"是以全球学者为主线，采集、加工和组织学术论文而形成的新型学术文献查询和分析系统，可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容，当前同舟云学术共收录了国内外主流学术期刊6万余种，收集的期刊论文及会议论文总量共计约1.5亿篇，并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询！咨询电话：010-8811{复制后删除}0370

www.globalauthorid.com

TOP

Copyright © 2019-2024 北京同舟云网络信息技术有限公司
京公网安备11010802033243号京ICP备18003416号-3