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Analysis of amorphous-nanocrystalline silicon thin films by time-of-flight elastic recoil detection analysis and high-resolution electron microscopy

  • Published:2013-06 Issue: Volume:275 Page:19-22
  • ISSN:0169-4332
  • Container-title:Applied Surface Science
  • language:en
  • Short-container-title:Applied Surface Science

Author:

Gracin D.,Siketić Z.,Juraić K.,Čeh M.

Funder

Croatian Ministry of Science Education and Sport

Unity through Knowledge Fund

The thin film silicon on the amorphous to crystalline transition

Physics and applications of nanostructures and bulk matter

Publisher

Elsevier BV

Subject

Surfaces, Coatings and Films,Condensed Matter Physics,Surfaces and Interfaces,General Physics and Astronomy,General Chemistry

Reference13 articles.

1. Potential for low dimensional structures in photovoltaics;Green;Materials Science and Engineering B: Solid State Materials for Advanced Technology,2000

2. Third generation photovoltaics: solar cells for 2020 and beyond;Green;Physica E: Low-Dimensional Systems and Nanostructures,2002

3. Spectral response of amorphous-nanocrystalline silicon thin films;Gracin;Journal of Non-Crystalline Solids,2008

4. Stress-induced nucleation of microcrystalline silicon from amorphous phase;Fujiwara;Japanese Journal of Applied Physics,2002

5. Microcrystalline silicon nucleation sites in the sub-surface of hydrogenated amorphous silicon;Fujiwara;Surface Science,2002

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