Factors affecting the retention of Cs+ primary ions in Si-Reference-Cited by-同舟云学术

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Factors affecting the retention of Cs+ primary ions in Si

Published:2004-06 Issue: Volume:231-232 Page:90-93
ISSN:0169-4332
Container-title:Applied Surface Science
language:en
Short-container-title:Applied Surface Science

Author:

van der Heide P.A.W.,Lupu C.,Kutana A.,Rabalais J.W.

Publisher

Elsevier BV

Subject

Surfaces, Coatings and Films,Condensed Matter Physics,Surfaces and Interfaces,General Physics and Astronomy,General Chemistry

Reference8 articles.

1. Sputtering of PtSi

2. Single grain junction studies of ZnO varistors—Theory and experiment

3. Surface cesium concentrations in cesium‐ion‐bombarded elemental and compound targets

4. Computer simulation of atomic-displacement cascades in solids in the binary-collision approximation

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