How to extract spontaneous polarization information from experimental data in electric force microscopy
Author:
Publisher
Elsevier BV
Subject
Materials Chemistry,Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics
Reference8 articles.
1. Formation and observation of 50 nm polarized domains in PbZr1−xTixO3 thin film using scanning probe microscope
2. Nanoscale Scanning Force Imaging of Polarization Phenomena in Ferroelectric Thin Films
3. Modification and detection of domains on ferroelectric PZT films by scanning force microscopy
4. Evaluation of electrically polar substances by electric scanning force microscopy. Part II: Measurement signals due to electromechanical effects
5. Evaluation of electrically polar substances by electric scanning force microscopy. Part I: Measurement signals due to maxwell stress
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