High-resolution angle-resolved lateral piezoresponse force microscopy: Visualization of in-plane piezoresponse vectors
Author:
Affiliation:
1. Department of Physics, KAIST, Daejeon 34141, South Korea
Funder
National Research Foundation
Publisher
AIP Publishing
Subject
Instrumentation
Link
http://aip.scitation.org/doi/pdf/10.1063/1.5052662
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1. IMAGING AND CONTROL OF DOMAIN STRUCTURES IN FERROELECTRIC THIN FILMS VIA SCANNING FORCE MICROSCOPY
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