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Yield improvement analysis with parameter-screening factorials

Published:2012-03 Issue:3 Volume:12 Page:1021-1040
ISSN:1568-4946
Container-title:Applied Soft Computing
language:en
Short-container-title:Applied Soft Computing

Author:

Yamwong Worraluk,Achalakul Tiranee

Publisher

Elsevier BV

Subject

Software

Reference28 articles.

1. Data warehousing for manufacturing yield improvement;Rutledge,2000

2. Just enough database for manufacturing yield analysis;Rutledge,1999

3. Pareto analysis: when quality-control demands decisions;Logan;Oper. Manage.,2002

4. Survey of sampling-based methods for uncertainty and sensitivity analysis;Helton,2004

5. Global Sensitivity Analysis: The Primer;Saltelli,2011

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1. A fast ramp-up framework for wafer yield improvement in semiconductor manufacturing systems;Journal of Manufacturing Systems;2024-10

2. An inverse-distance weighting genetic algorithm for optimizing the wafer exposure pattern for enhancing OWE for smart manufacturing;Applied Soft Computing;2020-09

3. Screening and Optimizing the Sensitive Parameters of BTOPMC Model Based on UQ-PyL Software: Case Study of a Flood Event in the Fuji River Basin, Japan;Journal of Hydrologic Engineering;2020-09

4. Bayesian inference for mining semiconductor manufacturing big data for yield enhancement and smart production to empower industry 4.0;Applied Soft Computing;2018-07

5. Simulation-based production analysis of mixed-model assembly lines with uncertain processing times;Journal of Simulation;2018-02-19

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