Growth of heavy ion-induced nanodots at the SiO2–Si interface: Correlation with ultrathin gate oxide reliability-Reference-Cited by-同舟云学术

登录注册会员服务联系我们

Growth of heavy ion-induced nanodots at the SiO2–Si interface: Correlation with ultrathin gate oxide reliability

Published:2005-12 Issue:52-54 Volume:351 Page:3834-3838
ISSN:0022-3093
Container-title:Journal of Non-Crystalline Solids
language:en
Short-container-title:Journal of Non-Crystalline Solids

Author:

Touboul A.D.,Carlotti J.F.,Marinoni M.,Caussanel M.,Ramonda M.,Guasch C.,Bruguier G.,Bonnet J.,Saigné F.,Gasiot J.

Publisher

Elsevier BV

Subject

Materials Chemistry,Condensed Matter Physics,Ceramics and Composites,Electronic, Optical and Magnetic Materials

Reference34 articles.

1. On an expansion apparatus for making visible the tracks of ionising particles in gases and some results obtained by its use

2. �ber einige Bruchst�cke beim Zerplatzen des Thoriums

3. Disintegration of Uranium

4. Cloud-Chamber Studies of Fission Fragment Tracks

Cited by 19 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. The reliabilities of HfO₂-based ferroelectric devices under swift heavy ion irradiation;Japanese Journal of Applied Physics;2022-07-01

2. Investigating the latent reliability degradation of partially depleted SOI devices induced by high-energy heavy ions irradiation;Microelectronics Reliability;2019-11

3. High fluence swift heavy ion structure modification of the SiO 2 /Si interface and gate insulator in 65 nm MOSFETs;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2017-04

4. The generation, detection and measurement of laser-induced carbon plasma ions and their implantation effects on brass substrate;Radiation Effects and Defects in Solids;2016-05-03

5. Impact of Single Event Gate Rupture and Latent Defects on Power MOSFETs Switching Operation;IEEE Transactions on Nuclear Science;2014-08

同舟云学术

1.学者识别学者识别

2.学术分析学术分析

3.人才评估人才评估

"同舟云学术"是以全球学者为主线，采集、加工和组织学术论文而形成的新型学术文献查询和分析系统，可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容，当前同舟云学术共收录了国内外主流学术期刊6万余种，收集的期刊论文及会议论文总量共计约1.5亿篇，并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询！咨询电话：010-8811{复制后删除}0370

www.globalauthorid.com

TOP

Copyright © 2019-2024 北京同舟云网络信息技术有限公司
京公网安备11010802033243号京ICP备18003416号-3