RBS as a new primary direct reference method for measuring quantity of material-Reference-Cited by-同舟云学术

RBS as a new primary direct reference method for measuring quantity of material

Published:2017-09 Issue: Volume:406 Page:30-31
ISSN:0168-583X
Container-title:Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
language:en
Short-container-title:Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms

Author:

Jeynes C.^ORCID

Publisher

Elsevier BV

Subject

Instrumentation,Nuclear and High Energy Physics

Reference18 articles.

1. Chemical analysis of surfaces by use of large angle scattering of heavy charged particles;Turkevich;Science,1961

2. Accurate determination of quantity of material in thin films by Rutherford backscattering spectrometry;Jeynes;Anal. Chem.,2012

3. Certified ion implantation fluence by high accuracy RBS;Colaux;Analyst,2015

4. Antimony implanted in silicon – a thin layer reference material for surface analysis;Ecker;Nucl. Instrum. Methods B,2001

5. K.H. Ecker, U. Wätjen, A. Berger, R. Grötzschel, L. Persson, W. Pritzkow, M. Radtke, G. Riebe, H. Riesemeier, J. Vogl, Certification of Antimony Implanted in Silicon Wafer with a Silicon Dioxide Diffusion Barrier, IRMM-302, BAM-L001, European Commission – Joint Research Centre (European Communities and Bundesanstalt für Materialforschung und -prüfung), 2001.

Cited by 15 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Addressing forensic science challenges with nuclear analytical techniques – A review;Forensic Science International;2023-06

2. Bias and synergy in the self-consistent approach of data analysis of ion beam techniques;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2022-12

3. Processing of massive Rutherford Back-scattering Spectrometry data by artificial neural networks;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2021-04

4. Ion beam analysis for cultural heritage;Spectroscopy, Diffraction and Tomography in Art and Heritage Science;2021

5. Accurate quantification of high-purity uranium in coatings by small solid angle method;Applied Radiation and Isotopes;2020-10