Irradiation effects of 25MeV silicon ions on SiGe heterojunction bipolar transistors
Author:
Publisher
Elsevier BV
Subject
Instrumentation,Nuclear and High Energy Physics
Reference23 articles.
1. Silicon–Germanium Heterojunction Bipolar Transistors;Cressler,2003
2. Active 220- and 325-GHz Frequency Multiplier Chains in an SiGe HBT Technology
3. The total-dose-effects of gamma and proton irradiations on high-voltage silicon–germanium heterojunction bipolar transistors
4. Combined effect of bias and annealing in gamma and neutron radiation assurance tests of SiGe bipolar transistors for HEP applications
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2. Three-dimensional simulation of total ionizing dose effect on SiGe heterojunction bipolor transistor;Acta Physica Sinica;2022
3. Characterizing and modeling current gain degradation in bipolar transistor exposed to heavy ion radiation;Materials Science in Semiconductor Processing;2021-01
4. Degradation and annealing characteristics of NPN SiGe HBT exposed to heavy ions irradiation;Radiation Physics and Chemistry;2019-12
5. Impact of finger numbers on the performance of proton-radiated SiGe power HBTs at room and cryogenic temperatures;Microelectronics Reliability;2018-12
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