Quantum efficiency of back-illuminated CCD detectors in the VUV region (30–200nm)
Author:
Publisher
Elsevier BV
Subject
Instrumentation,Nuclear and High Energy Physics
Reference22 articles.
1. Performance of a thinned back-illuminated ion-implanted CCD as detector for a normal incidence EUV spectrograph
2. Bandgap Dependence and Related Features of Radiation Ionization Energies in Semiconductors
3. Quantum efficiency measurements and modeling of ion-implanted, laser-annealed charge-coupled devices: x-ray, extreme-ultraviolet, ultraviolet, and optical data
4. Characterization of a charge-coupled-device detector in the 1100–014-nm (1-eV to 9-keV) spectral region
5. UV-responsive CCD image sensors with enhanced inorganic phosphor coatings
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