Author:
Boudreault G,Elliman R.G,Grötzschel R,Gujrathi S.C,Jeynes C,Lennard W.N,Rauhala E,Sajavaara T,Timmers H,Wang Y.Q,Weijers T.D.M
Subject
Instrumentation,Nuclear and High Energy Physics
Reference50 articles.
1. Fundamentals of Surface and Thin Film Analysis;Feldman,1986
2. Handbook of Modern Ion Beam Materials Analysis,1995
3. Forward Recoil Spectrometry – Applications to Hydrogen Determination in Solids;Tirira,1996
4. Multiple and double scattering contributions to depth resolution and low energy background in hydrogen elastic recoil detection
5. Multiple scattering effects in depth resolution of elastic recoil detection
Cited by
23 articles.
订阅此论文施引文献
订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献