Characterization of swift heavy ion tracks in CaF2 by scanning force and transmission electron microscopy
Author:
Publisher
Elsevier BV
Subject
Instrumentation,Nuclear and High Energy Physics
Reference47 articles.
1. Atomic-force-microscopy observations of tracks induced by swift Kr ions in mica
2. STM and AFM observations of latent tracks
3. Ion track diameters in mica studied with scanning force microscopy
4. Surface modifications of LiNbO3 single crystals induced by swift heavy ions
5. Impacts of GeV heavy ions in amorphous metallic alloys investigated by near-field scanning microscopy
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