Author:
Tempez Agnès,Legendre Sébastien,Chapon Patrick
Subject
Instrumentation,Nuclear and High Energy Physics
Reference14 articles.
1. M.S Lee, Analysis of thin and thick films, in: Mass Spectrometry Handbook, Chapter 41, Wiley, May 2012, ISBN: 978-0-470-53673-5.
2. Ionization processes in a grimm type source used in pulsed r.f.-glow-discharge time-of- flight mass spectrometry;Tempez,2007
3. Comparative investigation on the characteristics of a radiofrequency and pulsed radiofrequency glow discharge orthogonal time of flight mass spectrometer;Lobo;J. Anal. At. Spectrom.,2009
4. Pulsed radiofrequency glow discharge time-of-flight mass spectrometer for the direct analysis of bulk and thin coated glasses;Muñiz;J. Anal. At. Spectrom.,2008
5. Minor elements determination and evaluation of diffusion/segregation effects on ultra-thin layers using pulsed-RF-GD-TOFMS;Pisonero;J. Anal. At. Spectrom.,2011
Cited by
12 articles.
订阅此论文施引文献
订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献