A comparison of non-pulsed radiofrequency and pulsed radiofrequency glow discharge orthogonal time-of-flight mass spectrometry for analytical purposes-Reference-Cited by-同舟云学术

A comparison of non-pulsed radiofrequency and pulsed radiofrequency glow discharge orthogonal time-of-flight mass spectrometry for analytical purposes

Published:2009 Issue:10 Volume:24 Page:1373
ISSN:0267-9477
Container-title:Journal of Analytical Atomic Spectrometry
language:en
Short-container-title:J. Anal. At. Spectrom.

Author:

Lobo L.,Pisonero J.,Bordel N.,Pereiro R.,Tempez A.,Chapon P.,Michler J.,Hohl M.,Sanz-Medel A.

Publisher

Royal Society of Chemistry (RSC)

Subject

Spectroscopy,Analytical Chemistry

Link

http://pubs.rsc.org/en/content/articlepdf/2009/JA/B908038D

Reference18 articles.

1. Radio-frequency glow discharge spectrometry:

2. Radiofrequency glow-discharge devices for direct solid analysis

3. Application of RF GDMS for trace element analysis of nonconducting La 0.65 Sr 0.3 MnO 3 ceramic layers

Cited by 51 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Pulsed radiofrequency glow discharge time-of-flight mass spectrometry: Depth profile analysis of multilayers on conductive and non-conductive substrates;Spectrochimica Acta Part B: Atomic Spectroscopy;2020-06

2. Plasma profiling time-of-flight mass spectrometry for fast elemental analysis of semiconductor structures with depth resolution in the nanometer range;Semiconductor Science and Technology;2020-02-11

4. Depth profiling by pulsed glow discharge time-of-flight mass spectrometry with a combined hollow cathode cell;Journal of Analytical Atomic Spectrometry;2020

5. Improving the analytical performance of pulsed-GD-SFMS for multi-elemental depth profile analysis of heat-treated Zn coatings on extruded aluminium;Journal of Analytical Atomic Spectrometry;2019