Depth profiling by pulsed glow discharge time-of-flight mass spectrometry with a combined hollow cathode cell-Reference-Cited by-同舟云学术

Depth profiling by pulsed glow discharge time-of-flight mass spectrometry with a combined hollow cathode cell

Published:2020 Issue:8 Volume:35 Page:1587-1596
ISSN:0267-9477
Container-title:Journal of Analytical Atomic Spectrometry
language:en
Short-container-title:J. Anal. At. Spectrom.

Author:

Gubal Anna¹²³⁴^ORCID,Chuchina Victoria¹²³⁴^ORCID,Lyalkin Yegor¹²³⁴^ORCID,Mikhailovskii Vladimir¹²³⁴^ORCID,Yakobson Viktor⁵⁶⁴,Solovyev Nikolay¹²³⁴⁷^ORCID,Ganeev Alexander¹²³⁴⁸^ORCID

Affiliation:

1. St. Petersburg State University

2. Institute of Chemistry

3. 199034 St. Petersburg

4. Russia

5. Joint Stock Company “Research and Production Corporation S.I. Vavilova”

6. 192171 St. Petersburg

7. Institute of Technology Sligo

8. Institute of Toxicology of Federal Medico-Biological Agency

Abstract

A combined hollow cathode microsecond direct current pulsed glow discharge time-of-flight mass spectrometry system has proved its efficiency for quantification; however, it has not been properly tested for the purpose of depth analysis.

Funder

Russian Science Foundation

Publisher

Royal Society of Chemistry (RSC)

Subject

Spectroscopy,Analytical Chemistry

Link

http://pubs.rsc.org/en/content/articlepdf/2020/JA/D0JA00088D

Reference52 articles.

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2. Depth profile analysis with glow discharge spectrometry

3. Towards nanometric resolution in multilayer depth profiling: a comparative study of RBS, SIMS, XPS and GDOES