Study of the Au-Cr bilayer system using X-ray reflectivity, GDOES, and ToF-SIMS-Reference-Cited by-同舟云学术

Study of the Au-Cr bilayer system using X-ray reflectivity, GDOES, and ToF-SIMS

Published:2018-04-17 Issue:11 Volume:50 Page:1213-1217
ISSN:0142-2421
Container-title:Surface and Interface Analysis
language:en
Short-container-title:Surf Interface Anal

Author:

Jonnard Philippe¹^ORCID,Modi Mohammed H.²,Le Guen Karine¹,Aneshwari Nargish²,Sinha Mangalika²,Idir Mourad³,Chapon Patrick⁴,Galtayries Anouk⁵

Affiliation:

1. Laboratoire de Chimie Physique-Matière et Rayonnement; CNRS UMR 7614, Faculté des Sciences et Ingénierie, Sorbonne Université; 4 place Jussieu, F-75252 Paris cedex 05 France

2. Soft X-ray Applications Lab; Raja Ramanna Centre for Advanced Technology; Indore 452013 India

3. Brookhaven National Laboratory - NSLS II; Upton NY 11973-5000 USA

4. HORIBA Scientific; Avenue de la Vauve, Passage Jobin YvonCS 45002 91120 Palaiseau France

5. Chimie ParisTech, PSL Université Paris, CNRS; Institut de Recherche de Chimie Paris (IRCP); 11 rue Pierre et Marie Curie F-75005 Paris France

Publisher

Wiley

Subject

Materials Chemistry,Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics,General Chemistry

Link

http://onlinelibrary.wiley.com/wol1/doi/10.1002/sia.6445/fullpdf

Reference10 articles.

1. Nanometer-designed Al/SiC periodic multilayers: characterization by a multi-technique approach;Galtayries;Surf Interface Anal,2010

2. Towards nanometric resolution in multilayer depth profiling: a comparative study of RBS, SIMS, XPS and GDOES;Galindo;Anal Bioanal Chem,2010

3. Characterization of EUV periodic multilayers;Le Guen;X-Ray Spectrom,2011

4. Sputter depth profiling of Mo/B4C/Si and Mo/Si multilayer nanostructures: A round-robin characterization by different techniques;Ber;Thin Solid Films,2013

Cited by 2 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Interdiffusion behaviors observation in TiN/ZrO N bilayer by XAS and ToF-SIMS;Applied Surface Science;2020-10

2. Depth profiling by pulsed glow discharge time-of-flight mass spectrometry with a combined hollow cathode cell;Journal of Analytical Atomic Spectrometry;2020