HRBS/channeling studies of ultra-thin ITO films on Si
Author:
Publisher
Elsevier BV
Subject
Instrumentation,Nuclear and High Energy Physics
Reference16 articles.
1. Monolayer resolution in Rutherford backscattering spectroscopy
2. Monolayer resolution in medium-energy ion-scattering experiments on theNiSi2(111) surface
3. Monolayer analysis in Rutherford backscattering spectroscopy
4. A high-resolution electrostatic spectrometer for the investigation of near-surface layers in solids by high-resolution Rutherford backscattering with MeV ions
5. A high resolution magnetic spectrograph for ion beam analysis
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