Monolayer resolution in Rutherford backscattering spectroscopy-Reference-Cited by-同舟云学术

Monolayer resolution in Rutherford backscattering spectroscopy

Published:1995-05 Issue:1-4 Volume:99 Page:472-475
ISSN:0168-583X
Container-title:Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
language:en
Short-container-title:Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms

Author:

Kimura K.,Ohshima K.,Nakajima K.,Fujii Y.,Mannami M.,Gossmann H.-J.

Publisher

Elsevier BV

Subject

Instrumentation,Nuclear and High Energy Physics

Reference13 articles.

1. Rutherford Scattering of Protons in the Surface Layers of a Tungsten Single Crystal

2. Ion Beam Surface Layer Analysis;Hirvonen,1976

3. Ion Beam Surface Layer Analysis;Fenerstein,1976

4. A high-resolution electrostatic spectrometer for the investigation of near-surface layers in solids by high-resolution Rutherford backscattering with MeV ions

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