Heavy-ion induced current through an oxide layer-Reference-Cited by-同舟云学术

Heavy-ion induced current through an oxide layer

Published:2007-07 Issue:1 Volume:260 Page:309-313
ISSN:0168-583X
Container-title:Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
language:en
Short-container-title:Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms

Author:

Takahashi Yoshihiro,Ohki Takahiro,Nagasawa Takaharu,Nakajima Yasuhito,Kawanabe Ryu,Ohnishi Kazunori,Hirao Toshio,Onoda Shinobu,Mishima Kenta,Kawano Katsuyasu,Itoh Hisayoshi

Publisher

Elsevier BV

Subject

Instrumentation,Nuclear and High Energy Physics

Reference7 articles.

1. Single-event effects in SOI technologies and devices

2. Studies of charge collection mechanisms in SOI devices using a heavy-ion microbeam

3. SEU-sensitive volumes in bulk and SOI SRAMs from first-principles calculations and experiments

4. Study of single-event current pulses induced in SOI diodes by collimated swift heavy-ions micro-beams

5. Charge collection in SOI capacitors and circuits and its effect on SEU hardness

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