SEU-sensitive volumes in bulk and SOI SRAMs from first-principles calculations and experiments
Author:
Affiliation:
1. Sandia Nat. Labs., Albuquerque, NM, USA
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering,Nuclear Energy and Engineering,Nuclear and High Energy Physics
Link
http://xplorestaging.ieee.org/ielx5/23/21189/00983148.pdf?arnumber=983148
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