Evolution of radiation-induced carbon–oxygen-related defects in silicon upon annealing: LVM studies
Author:
Publisher
Elsevier BV
Subject
Instrumentation,Nuclear and High Energy Physics
Reference16 articles.
1. Oxygen in Silicon,1994
2. Oxygen and Carbon Clustering in Cz-Si during Electron Irradiation at Elevated Temperatures
3. Carbon-related radiation damage centres in Czochralski silicon
4. A model for radiation damage effects in carbon-doped crystalline silicon
Cited by 31 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. Effect of Electron–Phonon Interaction and γ-Ray Irradiation on the Reverse Currents of Silicon Photodiodes;Semiconductors;2021-01
2. First-principles Study of the Impact of Hydrogen Passivation on the Charge State Transition Levels of the CiOi(Sii)n Defect Complexes in Silicon;Silicon;2020-07-16
3. Peculiarities of changes in the structure and electrophysical characteristics of n-Si under the effect of various thermal treatment regimes;Reports of the National Academy of Sciences of Ukraine;2020-06
4. The CiCs(SiI)n Defect in Silicon from a Density Functional Theory Perspective;Materials;2018-04-16
5. Experimental and theoretical study of the C4defect in neutron irradiated silicon;Journal of Applied Physics;2018-04-14
1.学者识别学者识别
2.学术分析学术分析
3.人才评估人才评估
"同舟云学术"是以全球学者为主线，采集、加工和组织学术论文而形成的新型学术文献查询和分析系统，可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容，当前同舟云学术共收录了国内外主流学术期刊6万余种，收集的期刊论文及会议论文总量共计约1.5亿篇，并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询！咨询电话：010-8811{复制后删除}0370
www.globalauthorid.com
TOP
Copyright © 2019-2024 北京同舟云网络信息技术有限公司 京公网安备11010802033243号 京ICP备18003416号-3