The new Surrey ion beam analysis facility-Reference-Cited by-同舟云学术

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The new Surrey ion beam analysis facility

Published:2004-06 Issue: Volume:219-220 Page:405-409
ISSN:0168-583X
Container-title:Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
language:en
Short-container-title:Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms

Author:

Simon A.,Jeynes C.,Webb R.P.,Finnis R.,Tabatabaian Z.,Sellin P.J.,Breese M.B.H.,Fellows D.F.,van den Broek R.,Gwilliam R.M.

Publisher

Elsevier BV

Subject

Instrumentation,Nuclear and High Energy Physics

Reference11 articles.

1. Recent developments at HVEE

2. The novel ultrastable HVEE 3.5 MV Singletron™ accelerator for nanoprobe applications

3. The Oxford submicron nuclear microscopy facility

4. Materials Analysis Using a Nuclear Microprobe;Breese,1996

5. Ion source brightness and nuclear microprobe applications

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